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Created with Pixso. 2-Inch C-Plane Sapphire Substrate for Process Development & Equipment Calibration

2-Inch C-Plane Sapphire Substrate for Process Development & Equipment Calibration

Brand Name: ZMSH
MOQ: 25pcs
Delivery Time: 2-4 Weeks
Payment Terms: T/T
Detail Information
Place of Origin:
SHANGHAI,CHINA
Material:
Single-Crystal Al₂O₃
Diameter:
50.8 Mm
Orientation:
C-plane (0001)
Thickness:
430 µm ± 25 µm
Surface Finish:
SSP
Bow:
<10 µm
Grade:
Dummy Grade
Product Description

2-Inch C-Plane Sapphire Substrate for Process Development & Equipment Calibration


Product Overview


This 2-inch C-plane sapphire substrate is manufactured from high-purity single-crystal aluminum oxide (Al₂O₃) using advanced crystal growth and precision slicing techniques. Featuring a Single-Side Polished (SSP) surface, stable thickness, and low bow control, this substrate is ideal for equipment calibration, thin-film deposition trials, and non-critical semiconductor or photonics R&D.
Each wafer undergoes strict dimensional and visual inspection, and all shipments include full batch traceability.


Key Features


  • High-Purity Sapphire (Al₂O₃): Excellent mechanical strength, thermal stability, and chemical resistance.

  • C-Plane (0001) Orientation: Standard orientation for GaN, optical coatings, and laser applications.

  • SSP Surface: Polished front side ensures uniform deposition; backside lapped for stable fixture handling.

  • Low Bow <10 µm: Maintains flatness for reliable processing.

  • Dummy Grade: Cost-effective for process experiments and equipment tuning.

  • Strict Quality Control: Batch No. and Lot No. provided for full traceability.


Technical Specifications


Item Specification
Product 2-inch C-Plane SSP Sapphire Substrate
Material Single-Crystal Al₂O₃
Diameter 50.8 mm
Orientation C-plane (0001)
Thickness 430 µm ± 25 µm
Surface Finish SSP (Single Side Polished)
Bow <10 µm
Grade Dummy Grade
Quantity 25 pcs


Applications


This dummy-grade sapphire substrate is suitable for:

  • Deposition trials (ALD / PVD / CVD / MOCVD)

  • Equipment calibration and parameter tuning

  • Coating uniformity and process evaluation

  • Thin-film R&D and non-critical photonics experiments

  • University training and laboratory teaching

  • Optical testing and functional demonstration setups


Packaging & Quality Assurance


  • Class 100 cleanroom inspection and handling

  • 25 pcs per wafer cassette with protective separators

  • Vacuum-sealed, anti-static packaging to prevent contamination

  • Lot and batch labels included for full traceability

  • Visual defect screening before shipment


FAQ


1. What is the main difference between dummy-grade and prime-grade sapphire substrates?


Dummy-grade substrates have correct mechanical dimensions but may not meet the optical, surface defect, or epi-ready standards required for GaN growth or device manufacturing. They are ideal for process testing and calibration.


2. Can I use this substrate for epitaxial growth?


For general process verification, yes.
However, for high-quality GaN or epitaxial device fabrication, we recommend switching to prime-grade or epi-ready DSP sapphire for better flatness, TTV, and surface defect control.


3. Do you offer customized orientation, thickness, or polishing?


Yes. We support custom:

  • Thickness (200–1500 µm)

  • SSP / DSP

  • C-plane, A-plane, R-plane, M-plane

  • Laser marking, orientation flats, custom chamfering
    Please contact us with your specifications.


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