| Brand Name: | ZMSH |
| MOQ: | 25 |
| Delivery Time: | 2-4 weeks |
| Payment Terms: | T/T |
Our 6 Inch SiC As-Cut Wafer is produced directly from high-quality silicon carbide crystal ingots through precision wire slicing. The wafer retains the original as-cut surface condition without subsequent grinding, lapping, polishing, or CMP processing.
Compared with polished SiC substrates, as-cut wafers provide a more cost-effective solution for customers who require raw silicon carbide wafers for downstream machining, thinning, grinding, polishing, equipment calibration, process development, or material testing.
The wafers can be supplied with customized thickness, crystal type, conductivity type, orientation, and surface condition according to customer requirements.
6-inch / 150 mm silicon carbide wafer
Raw-cut / as-cut surface
No CMP or final polishing
Suitable for grinding, lapping and polishing processes
Available in different SiC crystal types
Thickness can be customized
Suitable for equipment testing and process development
Lower cost compared with polished SiC substrates
Custom specifications available for R&D and industrial applications
| Item | Specification |
|---|---|
| Material | Silicon Carbide (SiC) |
| Product Type | As-Cut Wafer / Raw-Cut Wafer |
| Diameter | 6 Inch / 150 mm |
| Crystal Polytype | 4H-SiC / 6H-SiC / Custom |
| Conductivity Type | N-Type / Semi-Insulating / Custom |
| Orientation | (0001) or Customized |
| Thickness | Customized |
| Surface | As-Cut, Unpolished |
| Processing | Wire Sliced |
| Edge | Flat / Notch / Customized |
| Grade | Research / Dummy / Test / Customized |
| Quantity | Sample and Batch Orders Available |
Final specifications should be confirmed according to application and customer requirements.
The surface of the SiC wafer remains in the original condition after wire slicing and may show visible cutting marks or linear surface textures.
This type of wafer is normally supplied before:
Grinding
Lapping
Thinning
Mechanical polishing
CMP polishing
Surface finishing
For customers who need SSP, DSP or CMP polished SiC wafers, additional processing options are also available.
6-inch SiC as-cut wafers are suitable for evaluating grinding wheels, lapping plates, abrasives and machining parameters.
They can be used as starting wafers for developing mechanical polishing and chemical mechanical polishing processes.
Suitable for wafer handling, grinding, thinning, polishing and other semiconductor equipment testing.
Used by universities, research institutes and semiconductor manufacturers for developing SiC wafer processing technologies.
As-cut SiC wafers can also be used as lower-cost test wafers when device-grade polished surfaces are not required.
Suitable for research related to silicon carbide machining, surface treatment, crystal processing and material characterization.
For applications where a polished device-grade surface is not necessary, as-cut wafers can significantly reduce material cost.
They are especially suitable for customers developing their own:
Wafer grinding processes
Wafer thinning processes
Surface polishing technology
CMP processes
Semiconductor equipment
SiC machining technology
The customer can perform subsequent processing according to their own process requirements.
We can provide customized SiC as-cut wafers according to your technical requirements, including:
Wafer diameter
Wafer thickness
Thickness tolerance
Crystal polytype
Conductivity type
Crystal orientation
Off-axis angle
Flat or notch configuration
Surface condition
Edge processing
Quantity
Additional grinding or polishing
For special test wafer requirements, please send us your drawing or specification sheet for evaluation.
In addition to as-cut SiC wafers, further processing can be provided upon request:
As-Cut → Grinding → Lapping → SSP → DSP → CMP
This allows customers to purchase SiC wafers at different processing stages depending on their production or R&D requirements.
When requesting a quotation, please provide the following information:
Wafer diameter
Required thickness
Crystal polytype
Conductivity type
Crystal orientation
Surface condition
Flat or notch requirement
Quantity
Application
Any special tolerance requirements
Samples and customized batch orders are available.
Contact us for technical evaluation, quotation and lead time.